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KAPTEOS APPLICABLE MARKETS
Kapteos offers solutions for the following Markets/Applications:
· Antennas – Measurement of E-fields Emitted by Antennas
· · NFACS (Near Field Antenna Characterization Solution)
· · 3D NFACS (Near Field Antenna Characterization Solution)
· · Vectorial & Characterization of Ultra Compact Antennas
· EMC -Measurement of E-Fields in Electromagnetic Compatibility
· EMP – Time-resolved measurements of Electromagnetic Pulse
· High Temperature – Measurement in High Temperature
· High Voltage – Measurement of E-fields in High Voltage
· Measuring the E-Field around a Laptop
· MRI – Measurement of E-fields inside an MRI
· Plasma – Measurement of E-fields inside Plasma
· SAR – Specific Absorption Rate (SAR) assessment