KAPTEOS PRODUCT LINE
The Value and Benefits of Electro-optic Technology
Kapteos Products
• eoSense™ Optic to Electro Converter
• eoProbe™ to measure E-field (EMF)
•• eoCal™ – eoProbe Calibration
•• eoLink™ – 100m Fiber optic extension
•• eoPod™ – eoProbe Articulated Arm and Stand
Kapteos – On-Site Training
• Applications (Target Markets)
• Antennas – Measurement of E-fields Emitted by Antennas• NFACS (Near Field Antenna Characterization Solution)
• 3D NFACS (Near Field Antenna Characterization Solution)
• Vectorial & Characterization of Ultra Compact Antennas
• EMC -Measurement of E-Fields in Electromagnetic Compatibility
• EMP – Time-resolved measurements of Electromagnetic Pulse
• High Temperature – Measurement in High Temperature
• High Voltage – Measurement of E-fields in High Voltage
• Measuring the E-Field around a Laptop
• MRI – Measurement of E-fields inside an MRI
• Plasma – Measurement of E-fields inside Plasma
• SAR – Specific Absorption Rate (SAR) assessment
• Online Software Simulation Tool – Determine Online, before you purchase, the value of the Kapteos Solution!
• FAQ’s – A wealth of Information!
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MANUFACTURERS
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KAPTEOS APPLICABLE MARKETS
Kapteos offers solutions for the following Markets/Applications:
· Antennas – Measurement of E-fields Emitted by Antennas
· · NFACS (Near Field Antenna Characterization Solution)
· · 3D NFACS (Near Field Antenna Characterization Solution)
· · Vectorial & Characterization of Ultra Compact Antennas
· EMC -Measurement of E-Fields in Electromagnetic Compatibility
· EMP – Time-resolved measurements of Electromagnetic Pulse
· High Temperature – Measurement in High Temperature
· High Voltage – Measurement of E-fields in High Voltage
· Measuring the E-Field around a Laptop
· MRI – Measurement of E-fields inside an MRI
· Plasma – Measurement of E-fields inside Plasma
· SAR – Specific Absorption Rate (SAR) assessment