KAPTEOS PRODUCT LINE
The Value and Benefits of Electro-optic Technology
Kapteos Products
• eoSense™ Optic to Electro Converter
• eoProbe™ to measure E-field (EMF)
•• eoCal™ – eoProbe Calibration
•• eoLink™ – 100m Fiber optic extension
•• eoPod™ – eoProbe Articulated Arm and Stand
Kapteos – On-Site Training
• Applications (Target Markets)
• Antennas – Measurement of E-fields Emitted by Antennas• NFACS (Near Field Antenna Characterization Solution)
• 3D NFACS (Near Field Antenna Characterization Solution)
• Vectorial & Characterization of Ultra Compact Antennas
• EMC -Measurement of E-Fields in Electromagnetic Compatibility
• EMP – Time-resolved measurements of Electromagnetic Pulse
• High Temperature – Measurement in High Temperature
• High Voltage – Measurement of E-fields in High Voltage
• Measuring the E-Field around a Laptop
• MRI – Measurement of E-fields inside an MRI
• Plasma – Measurement of E-fields inside Plasma
• SAR – Specific Absorption Rate (SAR) assessment
• Online Software Simulation Tool – Determine Online, before you purchase, the value of the Kapteos Solution!
• FAQ’s – A wealth of Information!
RELIANT EMC PRODUCT LINES
MANUFACTURERS
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KAPTEOS Data Sheets & Application Notes
Application Notes:
Application Note: Comparison of different E-field measurement systems
Application Note: Antennas Pattern Characterization
Application Note: Near Field Antenna Pattern Characterization
Application Note: Measuring the Magnetic Fields required to produce Plasma
Application Note: Measuring the Magnetic Fields produced by an MRI Machine
Application Note: Measurement of E-fields in Electro Magnetic Compatibility
Application Note: E-field Measurement System Basic Technology
Application Note: Specific Absorption Rate Assessment
Application Note: High voltage (insulation, partial discharges…)
Application Note: Antennas Pattern Characterization
Application Note: Measuring the Magnetic Fields required to produce Plasma
Application Note: Measuring the Magnetic Fields produced by an MRI Machine
Application Note: Measuring Low RMS signal from a MRI Machine
Application Note: Measurement of E-fields in Electro Magnetic Compatibility
Product Data Sheets:
Kapteos Product Portfolio Data Sheet
Kapteos eoProbe Electric Field Probe Data Sheet
Kapteos eoSense Converter Data Sheet
Product Accessories Data Sheets:
Kapteos eoCal Electric Field Probe Calibration Data Sheet
Kapteos eoLink Fiber Optic Extension Data Sheet
Kapteos eoPod – eoProbe Electric Field Probe articulated arm Data Sheet
YouTube Instructional Video Links:
Kapteos E field measurement system using none invasive electrooptic probes.
Partial discharges can be precisely measured with a sub-cm localisation thanks to the measurement an E field based on electrooptic probes.
https://www.youtube.com/watch?v=tUfamCvJ89s
Vectorial E field measurement in cold plasma
https://www.youtube.com/watch?v=JTb1pn4yJoU&feature=youtu.be