LAPLACE INSTRUMENTS PRODUCT LINE
Products by EMC Categories
Emissions
• Antennas
• EMC Emission Analyzers
• LISN
• Near Field Probes
• Pre-selector
• Reference Sources
• RF Sensors/Probes
• Test Cells
• Test Chambers
• Voltage Probe (PLIP)
Harmonic and Flicker
• AC2000A Harmonics & Flicker Analyzer
• AC1000 Clean Power Source
Immunity
• CDN’s
• Dips and Interrupts
• EFT & Burst
• ESD
• Power Amplifiers
• Sensors/Probes
• Surge
• Synthesizers
• Test Cells
• Test Chambers
Mains Filters
Product Software
RF Meters and Sensors
Systems
• Conducted Emissions
• Conducted RF immunity IEC1000-4-6
• Harmonic and Flicker
• Luminaire Test (EN55015)
• Non-RF Immunity IEC61000-4-4 IEC61000-4-5 IEC61000-4-11
• RF Emissions (CDN)
• RF Emissions (Cell/Chamber)
• RF Emissions (OATS)
• RF Immunity (Cell/Chamber) IEC61000-4-3
• Standards
• Sale! Radiated Emission Test System – Reduced!
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LAPLACE INSTRUMENTS EMISSIONS PRODUCTS
Laplace Instruments Emissions Products
Emissions measurement systems all comprise an input ’device’, such as an antenna or coupling network, plus an EMC analyzer or receiver. The EMC analyzer is the core of any system and provides the necessary signal measurement and subsequent processing of the results. Laplace offers a full range of all the above, plus test cells, EMC chambers and reference sources, all supplied as one integrated system with PC software for all control, display and report generation.
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TYPE |
COUPLING |
FREQUENCY RANGE |
NOTES |
TEST |
|
Free space |
30 MHz to 1 GHz |
Applies to all products without exception, unless deemed ‘benign’. |
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|
Via cables |
9KHz or 150KHz to 30Mhz. Start frequency defined by the relevant standard. |
Applies to all products connected via cables. Luminaires require the 9KHz start, other products 150KHz |
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Free space |
9KHz to 30MHz |
Applies to Luminaires only. |
For military and automotive products, different requirements apply. Laplace can supply a complete range of test equipment that covers virtually all the EMC measurement requirements. These integrated systems are designed to cope with the real world problems associated with the measurement of the low level signals in the presence of ambient noise and poor test sites.